X-ray Diffraction
From LIMSWiki
Jump to navigationJump to searchHigh-resolution X-ray diffraction is used to characterize thickness, crystallographic structure, and strain in thin epitaxial films. It employs parallel-beam optics. (Wikipedia)
- This page was last edited on 28 June 2011, at 20:17.
- Content is available under a Creative Commons Attribution-ShareAlike 4.0 International License unless otherwise noted.
- This page has been accessed 890 times.
- Privacy policy
- About LIMSWiki
- Disclaimers