X-ray Diffraction: Difference between revisions
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High-resolution X-ray diffraction is used to characterize thickness, crystallographic structure, and strain in thin epitaxial films. It employs parallel-beam optics. (Wikipedia) | |||
[[Category:X-ray Diffraction]] | [[Category:X-ray Diffraction]] | ||
Revision as of 12:51, 27 June 2011
High-resolution X-ray diffraction is used to characterize thickness, crystallographic structure, and strain in thin epitaxial films. It employs parallel-beam optics. (Wikipedia)
