X-ray Diffraction: Difference between revisions

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Revision as of 20:17, 28 June 2011 view source Abouilly (talk \| contribs) 636 edits Changed a link to category. ← Older edit		Latest revision as of 21:41, 23 November 2011 view source Shawndouglas (talk \| contribs) Interface administrators, Administrators 48,561 edits Created redirect due to incorrect use of naming conventions.
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	~~High-resolution X-ray diffraction is used to characterize thickness, crystallographic structure, and strain in thin epitaxial films. It employs parallel-beam optics. (Wikipedia)~~		#REDIRECT [[X-ray scattering techniques]]
	[[~~Category:~~X-ray]]