Difference between revisions of "X-ray scattering techniques"
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'''X-ray scattering techniques''' are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering. | '''X-ray scattering techniques''' are a family of non-destructive analytical techniques which reveal [[information]] about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering. | ||
Revision as of 22:18, 13 September 2013
X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering.
