X-ray scattering techniques - Revision history

Shawndouglas: Turned into a transclusion

2022-09-21T15:53:14Z

Turned into a transclusion

← Older revision		Revision as of 15:53, 21 September 2022
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	~~'''~~X-ray scattering techniques~~''' are~~ a ~~family~~ of ~~non~~-~~destructive analytical techniques which reveal [[information]~~] ~~about the crystallographic structure, chemical composition,~~ and ~~physical properties of materials and thin films. These techniques are based on observing~~ the ~~scattered intensity of an X-ray beam hitting a sample~~ as ~~a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering~~.		{{wikipedia::X-ray scattering techniques}}
			==Notes==
	~~==References==~~		This article is a direct transclusion of [https://en.wikipedia.org/wiki/X-ray_scattering_techniques the Wikipedia article] and therefore may not meet the same editing standards as LIMSwiki.
	~~<references />~~

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			[[Category:Articles transcluded from other wikis]]
	[[Category:Scientific techniques]]		[[Category:Scientific techniques]]

Shawndouglas: Added cat

2014-08-06T18:17:07Z

Added cat

← Older revision		Revision as of 18:17, 6 August 2014
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	'''X-ray scattering techniques''' are a family of non-destructive analytical techniques which reveal [[information]] about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering.		'''X-ray scattering techniques''' are a family of non-destructive analytical techniques which reveal [[information]] about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering.

			==References==
			<references />

			<!---Place all category tags here-->
			[[Category:Scientific techniques]]

Shawndouglas: Internal link.

2013-09-13T22:18:12Z

Internal link.

← Older revision		Revision as of 22:18, 13 September 2013
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	'''X-ray scattering techniques''' are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering.		'''X-ray scattering techniques''' are a family of non-destructive analytical techniques which reveal [[information]] about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering.

Shawndouglas: Recreated article due to necessary redirect.

2011-11-23T21:44:44Z

Recreated article due to necessary redirect.

New page

'''X-ray scattering techniques''' are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. Among these techniques exists two primary methodologies: diffraction and scattering.